8 Agilent C/C User’s Guide Vol.2, Edition 5 In This Manual This manual provides information for measurement and analysis functions of Agilent C/C, and consists of the following chapters: • Sweep Measurements Describes how to perform sweep measurements. • Knob Sweep Measurements Describes how to perform knob sweep measurements. • Turn off Agilent C parameter analyser, the Panasonic monitor, and the microscope illumination lamp (L) • Logout off “Suss PM8 – Manual prober” with CAE on zone 11 (CMi+1) accounting computer. The Agilent / HP C Semiconductor Parameter Analyzer is a cost-effective, accurate laboratory bench top solution for advanced device characterization. Features and Specifications of the Agilent / HP C Analyzer include: General Features: Cost-effective, accurate laboratory bench top parameter analyzer. 4x Medium-power SMU, 2xVSU and 2xVMU.
C/C Semiconductor Parameter Analyzer User's Guide, General Information. Show Description. Covers product introduction, installation, LAN connection, file operation, print/plot function, etc. Agilent C and C Basic functions • Set measurement and/or stress conditions • Control measurement and/or stress execution • Perform arithmetic calculations • Display measured and calculated results on the LCD display • Perform graphical analysis • Store and recall measurement setups, and measurement and graphical display data. The Agilent C/C/B can force dangerous voltages ( V for HPSMU, and V for MPSMU) at the force, guard, and sense terminals. To prevent electric shock hazard, the following safety precautions must be observed during the use of the Agilent C/C/B.
Agilent C/C User's Guide Vol.2, Edition 5. In This Manual. This manual provides information for measurement and analysis functions of. GPIB Command Reference Agilent C Semiconductor Parameter Analyzer Agilent This manual describes about the C/C FLEX command set and the The time sink of manual device-testing procedures is reduced or eliminated manual probe station, an Agilent C semiconductor parameter analyzer.
0コメント